Effect of interface states on the instability under temperature stress in amorphous SiInZnO thin film transistor

Title
Effect of interface states on the instability under temperature stress in amorphous SiInZnO thin film transistor
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 16, Pages 162101
Publisher
AIP Publishing
Online
2011-10-18
DOI
10.1063/1.3645597

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