Effect of interface states on the instability under temperature stress in amorphous SiInZnO thin film transistor
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Title
Effect of interface states on the instability under temperature stress in amorphous SiInZnO thin film transistor
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 16, Pages 162101
Publisher
AIP Publishing
Online
2011-10-18
DOI
10.1063/1.3645597
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