Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

(2011) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors

(2011) Wan-Fang Chung et al.   APPLIED PHYSICS LETTERS

Developments in nanocrystal memory

(2011) Ting-Chang Chang et al.   Materials Today

Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors

(2010) Youngmin Jeong et al.   ACS Applied Materials & Interfaces

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress

(2010) Yu-Chun Chen et al.   APPLIED PHYSICS LETTERS

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

(2010) Chih-Tsung Tsai et al.   APPLIED PHYSICS LETTERS

Intrinsic carrier mobility in amorphous In–Ga–Zn–O thin-film transistors determined by combined field-effect technique

(2010) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Fast All-Transparent Integrated Circuits Based on Indium Gallium Zinc Oxide Thin-Film Transistors

(2010) A. Suresh et al.   IEEE ELECTRON DEVICE LETTERS

Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect

(2010) Chia-Sheng Lin et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Temperature-Dependent Transfer Characteristics of Amorphous InGaZnO4Thin-Film Transistors

(2009) Kazushige Takechi et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

High performance solution-processed amorphous zinc tin oxide thin film transistor

(2009) Seok-Jun Seo et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS