Measurement of avalanche multiplication utilizing Franz-Keldysh effect in GaN p-n junction diodes with double-side-depleted shallow bevel termination
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Title
Measurement of avalanche multiplication utilizing Franz-Keldysh effect in GaN p-n junction diodes with double-side-depleted shallow bevel termination
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 115, Issue 14, Pages 142101
Publisher
AIP Publishing
Online
2019-10-01
DOI
10.1063/1.5114844
References
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