Wide range doping control and defect characterization of GaN layers with various Mg concentrations

Title
Wide range doping control and defect characterization of GaN layers with various Mg concentrations
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 16, Pages 165706
Publisher
AIP Publishing
Online
2018-10-26
DOI
10.1063/1.5045257

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