1.8 mΩ·cm2vertical GaN-based trench metal–oxide–semiconductor field-effect transistors on a free-standing GaN substrate for 1.2-kV-class operation

Title
1.8 mΩ·cm2vertical GaN-based trench metal–oxide–semiconductor field-effect transistors on a free-standing GaN substrate for 1.2-kV-class operation
Authors
Keywords
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Journal
Applied Physics Express
Volume 8, Issue 5, Pages 054101
Publisher
Japan Society of Applied Physics
Online
2015-04-14
DOI
10.7567/apex.8.054101

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