Enhanced stability of complementary resistance switching in the TiN/HfOx/TiN resistive random access memory device via interface engineering
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Title
Enhanced stability of complementary resistance switching in the TiN/HfOx/TiN resistive random access memory device via interface engineering
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 108, Issue 8, Pages 083505
Publisher
AIP Publishing
Online
2016-02-27
DOI
10.1063/1.4942801
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