Role of Oxygen Vacancies at the TiO 2 /HfO 2 Interface in Flexible Oxide‐Based Resistive Switching Memory
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Title
Role of Oxygen Vacancies at the TiO
2
/HfO
2
Interface in Flexible Oxide‐Based Resistive Switching Memory
Authors
Keywords
-
Journal
Advanced Electronic Materials
Volume 5, Issue 5, Pages 1800833
Publisher
Wiley
Online
2019-04-03
DOI
10.1002/aelm.201800833
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- (2018) Jinshi Zhao et al. ACS Applied Materials & Interfaces
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- (2017) Jie Shang et al. Nanoscale
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- (2016) Tsung-Ling Tsai et al. APPLIED PHYSICS LETTERS
- Ultralow switching current in HfOx/ZnO bilayer with tunable switching power enabled by plasma treatment
- (2016) Yunfeng Lai et al. APPLIED PHYSICS LETTERS
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- (2016) Hongxia Li et al. MATERIALS RESEARCH BULLETIN
- Improved performance of ITO/TiO 2 /HfO 2 /Pt random resistive accessory memory by nitrogen annealing treatment
- (2016) Tengfei Deng et al. MICROELECTRONICS RELIABILITY
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- (2016) Yimao Cai et al. NANOTECHNOLOGY
- Enhanced resistive switching performance for bilayer HfO2/TiO2resistive random access memory
- (2016) Cong Ye et al. SEMICONDUCTOR SCIENCE AND TECHNOLOGY
- Reversible transition between bipolar and unipolar resistive switching in Cu2O/Ga2O3 binary oxide stacked layer
- (2016) Y. S. Zhi et al. AIP Advances
- Metal-Organic Framework Nanofilm for Mechanically Flexible Information Storage Applications
- (2015) Liang Pan et al. ADVANCED FUNCTIONAL MATERIALS
- High mechanical endurance RRAM based on amorphous gadolinium oxide for flexible nonvolatile memory application
- (2015) Hongbin Zhao et al. JOURNAL OF PHYSICS D-APPLIED PHYSICS
- Thermal crosstalk in 3-dimensional RRAM crossbar array
- (2015) Pengxiao Sun et al. Scientific Reports
- Direct Observation of Conversion Between Threshold Switching and Memory Switching Induced by Conductive Filament Morphology
- (2014) Haitao Sun et al. ADVANCED FUNCTIONAL MATERIALS
- Switching mechanism of double forming process phenomenon in ZrOx/HfOy bilayer resistive switching memory structure with large endurance
- (2014) Chun-Yang Huang et al. APPLIED PHYSICS LETTERS
- Improvement of Resistive Switching Uniformity for Al–Zn–Sn–O-Based Memory Device With Inserting HfO2 Layer
- (2014) Po-Tsun Liu et al. IEEE ELECTRON DEVICE LETTERS
- Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory
- (2014) IEEE ELECTRON DEVICE LETTERS
- Study of conduction and switching mechanisms in Al/AlOx/WOx/W resistive switching memory for multilevel applications
- (2013) Ye Zhang et al. APPLIED PHYSICS LETTERS
- HfOx bipolar resistive memory with robust endurance using ZrNx as buttom electrode
- (2013) Qigang Zhou et al. APPLIED SURFACE SCIENCE
- Bipolar ${\rm Ni}/{\rm TiO}_{2}/{\rm HfO}_{2}/{\rm Ni}$ RRAM With Multilevel States and Self-Rectifying Characteristics
- (2013) Chung-Wei Hsu et al. IEEE ELECTRON DEVICE LETTERS
- Endurance Degradation in Metal Oxide-Based Resistive Memory Induced by Oxygen Ion Loss Effect
- (2013) Bing Chen et al. IEEE ELECTRON DEVICE LETTERS
- High-performance bilayer flexible resistive random access memory based on low-temperature thermal atomic layer deposition
- (2013) Run-Chen Fang et al. Nanoscale Research Letters
- Metal–Oxide RRAM
- (2012) H.-S. Philip Wong et al. PROCEEDINGS OF THE IEEE
- Collective Motion of Conducting Filaments in Pt/n-Type TiO2/p-Type NiO/Pt Stacked Resistance Switching Memory
- (2011) Kyung Min Kim et al. ADVANCED FUNCTIONAL MATERIALS
- Transition of metallic and insulating Ti sub-oxides in bipolar resistive switching TiO x /TiO y frameworks due to oxygen vacancy drifts
- (2011) Yoon Cheol Bae et al. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
- Conduction mechanism of TiN/HfOx/Pt resistive switching memory: A trap-assisted-tunneling model
- (2011) Shimeng Yu et al. APPLIED PHYSICS LETTERS
- Effect of ZrOx/HfOx bilayer structure on switching uniformity and reliability in nonvolatile memory applications
- (2010) Joonmyoung Lee et al. APPLIED PHYSICS LETTERS
- Asymmetric bipolar resistive switching in solution-processed Pt/TiO2/W devices
- (2010) Kuyyadi P Biju et al. JOURNAL OF PHYSICS D-APPLIED PHYSICS
- Resistive Switching Characteristics of Sol–Gel Zinc Oxide Films for Flexible Memory Applications
- (2009) Sungho Kim et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Highly durable and flexible memory based on resistance switching
- (2009) Sungho Kim et al. SOLID-STATE ELECTRONICS
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