Defect identification in semiconductors with positron annihilation: Experiment and theory

Title
Defect identification in semiconductors with positron annihilation: Experiment and theory
Authors
Keywords
-
Journal
REVIEWS OF MODERN PHYSICS
Volume 85, Issue 4, Pages 1583-1631
Publisher
American Physical Society (APS)
Online
2013-11-15
DOI
10.1103/revmodphys.85.1583

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started