Fluorine passivation of vacancy defects in bulk germanium for Ge metal-oxide-semiconductor field-effect transistor application

Title
Fluorine passivation of vacancy defects in bulk germanium for Ge metal-oxide-semiconductor field-effect transistor application
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 101, Issue 7, Pages 072104
Publisher
AIP Publishing
Online
2012-08-16
DOI
10.1063/1.4746389

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