Defect identification in semiconductors with positron annihilation: Experiment and theory

标题
Defect identification in semiconductors with positron annihilation: Experiment and theory
作者
关键词
-
出版物
REVIEWS OF MODERN PHYSICS
Volume 85, Issue 4, Pages 1583-1631
出版商
American Physical Society (APS)
发表日期
2013-11-15
DOI
10.1103/revmodphys.85.1583

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