On the Switching Parameter Variation of Metal Oxide RRAM—Part II: Model Corroboration and Device Design Strategy

Title
On the Switching Parameter Variation of Metal Oxide RRAM—Part II: Model Corroboration and Device Design Strategy
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 59, Issue 4, Pages 1183-1188
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-02-23
DOI
10.1109/ted.2012.2184544

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