A Phenomenological Model for the Reset Mechanism of Metal Oxide RRAM

Title
A Phenomenological Model for the Reset Mechanism of Metal Oxide RRAM
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 12, Pages 1455-1457
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-11-10
DOI
10.1109/led.2010.2078794

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More