Fabrication and Characterization of Nanoscale NiO Resistance Change Memory (RRAM) Cells With Confined Conduction Paths

Title
Fabrication and Characterization of Nanoscale NiO Resistance Change Memory (RRAM) Cells With Confined Conduction Paths
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 10, Pages 3270-3275
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-08-26
DOI
10.1109/ted.2011.2161311

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