Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

(2012) Minkyung Bae et al.   IEEE ELECTRON DEVICE LETTERS

Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability

(2012) Yongsik Kim et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Effects of excess oxygen on operation characteristics of amorphous In-Ga-Zn-O thin-film transistors

(2011) Keisuke Ide et al.   APPLIED PHYSICS LETTERS

Light and bias stability of a-IGZO TFT fabricated by r.f. magnetron sputtering

(2011) Jun-Young Huh et al.   CURRENT APPLIED PHYSICS

Extraction of Subgap Donor States in a-IGZO TFTs by Generation–Recombination Current Spectroscopy

(2011) Minkyung Bae et al.   IEEE ELECTRON DEVICE LETTERS

Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

(2010) Sangwon Lee et al.   IEEE ELECTRON DEVICE LETTERS

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

(2010) Yong Woo Jeon et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Interface and bulk effects for bias—light-illumination instability in amorphous-In—Ga—Zn—O thin-film transistors

(2010) Kenji Nomura et al.   Journal of the Society for Information Display

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

Density of States of a-InGaZnO From Temperature-Dependent Field-Effect Studies

(2009) Charlene Chen et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors

(2009) Tze-Ching Fung et al.   JOURNAL OF APPLIED PHYSICS

Origins of High Mobility and Low Operation Voltage of Amorphous Oxide TFTs: Electronic Structure, Electron Transport, Defects and Doping

(2009) T. Kamiya et al.   Journal of Display Technology

Electronic structure of the amorphous oxide semiconductor a-InGaZnO4-x: Tauc-Lorentz optical model and origins of subgap states

(2009) Toshio Kamiya et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy

(2008) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

(2008) Kichan Jeon et al.   APPLIED PHYSICS LETTERS

Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

(2008) Jun-Hyun Park et al.   IEEE ELECTRON DEVICE LETTERS

Gallium–Indium–Zinc-Oxide-Based Thin-Film Transistors: Influence of the Source/Drain Material

(2008) Pedro Barquinha et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Physics of amorphous conducting oxides

(2008) John Robertson   JOURNAL OF NON-CRYSTALLINE SOLIDS

Disorder and instability processes in amorphous conducting oxides

(2008) John Robertson   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS