Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

Published 2010 View Full Article

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Title
Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 11, Pages 2988-3000
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-09-30
DOI
10.1109/ted.2010.2072926

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