Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy

Published 2008 View Full Article

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Title
Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 20, Pages 202117
Publisher
AIP Publishing
Online
2008-05-23
DOI
10.1063/1.2927306
References
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