Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

Density of States of a-InGaZnO From Temperature-Dependent Field-Effect Studies

(2009) Charlene Chen et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Trap densities in amorphous-InGaZnO4 thin-film transistors

(2008) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

(2008) Kichan Jeon et al.   APPLIED PHYSICS LETTERS

Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

(2008) Jun-Hyun Park et al.   IEEE ELECTRON DEVICE LETTERS

Source/Drain Series-Resistance Effects in Amorphous Gallium–Indium Zinc-Oxide Thin Film Transistors

(2008) Jaechul Park et al.   IEEE ELECTRON DEVICE LETTERS