Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Radiation damage to organic and inorganic specimens in the TEM

(2019) R.F. Egerton   MICRON

Spatially resolved steady-state negative capacitance

(2019) Ajay K. Yadav et al.   NATURE

Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy

(2019) Shiang Fang et al.   Nature Communications

Analysis of medium-range order based on simulated segmented ring detector STEM-images: amorphous Si

(2019) S. Hilke et al.   ULTRAMICROSCOPY

Local nanoscale strain mapping of a metallic glass during in situ testing

(2018) Christoph Gammer et al.   APPLIED PHYSICS LETTERS

Determination of the structural phase and octahedral rotation angle in halide perovskites

(2018) Roberto dos Reis et al.   APPLIED PHYSICS LETTERS

Subsampled STEM-ptychography

(2018) Andrew Stevens et al.   APPLIED PHYSICS LETTERS

Effect of composition on the structure of lithium- and manganese-rich transition metal oxides

(2018) Alpesh Khushalchand Shukla et al.   Energy & Environmental Science

In-situ Indentation and Correlated Precession Electron Diffraction Analysis of a Polycrystalline Cu Thin Film

(2018) Qianying Guo et al.   JOM

Path-separated electron interferometry in a scanning transmission electron microscope

(2018) Fehmi S Yasin et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

The evolution of precipitate crystal structures in an Al-Mg-Si(-Cu) alloy studied by a combined HAADF-STEM and SPED approach

(2018) J.K. Sunde et al.   MATERIALS CHARACTERIZATION

Strain Mapping of Two-Dimensional Heterostructures with Subpicometer Precision

(2018) Yimo Han et al.   NANO LETTERS

In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel

(2018) Thomas C. Pekin et al.   SCRIPTA MATERIALIA

Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence

(2018) Tim Grieb et al.   ULTRAMICROSCOPY

A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns

(2018) W. Xu et al.   ULTRAMICROSCOPY

Dr. Probe: A software for high-resolution STEM image simulation

(2018) J. Barthel   ULTRAMICROSCOPY

Introducing a non-pixelated and fast centre of mass detector for differential phase contrast microscopy

(2018) Felix Schwarzhuber et al.   ULTRAMICROSCOPY

Atomic Structure of Domain and Interphase Boundaries in Ferroelectric HfO2

(2018) Everett D. Grimley et al.   Advanced Materials Interfaces

Nanoscale elastic strain mapping of polycrystalline materials

(2018) Paul F. Rottmann et al.   Materials Research Letters

Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging

(2018) Yi Wang et al.   Microscopy

A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction

(2018) Ian J. Johnson et al.   MICROSCOPY AND MICROANALYSIS

Crystal Phase Mapping by Scanning Precession Electron Diffraction and Machine Learning Decomposition

(2018) Håkon W. Ånes et al.   MICROSCOPY AND MICROANALYSIS

Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography

(2018) Juan Gabriel Lozano et al.   NANO LETTERS

Probing Light Atoms at Sub-nanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography

(2018) Fehmi Yasin et al.   NANO LETTERS

Electron ptychography of 2D materials to deep sub-ångström resolution

(2018) Yi Jiang et al.   NATURE

Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images

(2018) J. Fatermans et al.   PHYSICAL REVIEW LETTERS

Direct Determination of Structural Heterogeneity in Metallic Glasses Using Four-Dimensional Scanning Transmission Electron Microscopy

(2018) Soohyun Im et al.   ULTRAMICROSCOPY

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

(2018) Christoph Mahr et al.   ULTRAMICROSCOPY

Prospects of annular differential phase contrast applied for optical sectioning in STEM

(2018) Z. Lee et al.   ULTRAMICROSCOPY

Measuring temperature-dependent thermal diffuse scattering using scanning transmission electron microscopy

(2018) Geoff Wehmeyer et al.   APPLIED PHYSICS LETTERS

A tunable path-separated electron interferometer with an amplitude-dividing grating beamsplitter

(2018) Fehmi S. Yasin et al.   APPLIED PHYSICS LETTERS

Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe

(2018) H. G. Brown et al.   PHYSICAL REVIEW LETTERS

Hollow Electron Ptychographic Diffractive Imaging

(2018) Biying Song et al.   PHYSICAL REVIEW LETTERS

Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose

(2018) Knut Müller-Caspary et al.   ULTRAMICROSCOPY

Measuring Structural Heterogeneities in Metallic Glasses Using Transmission Electron Microscopy

(2018) Lin Tian et al.   Metals

Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter

(2018) Tyler R. Harvey et al.   Physical Review Applied

Manifold learning of four-dimensional scanning transmission electron microscopy

(2018) Xin Li et al.   npj Computational Materials

Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

(2018) H.G. Brown et al.   ULTRAMICROSCOPY

Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy.

(2018) Benedikt Haas et al.   ULTRAMICROSCOPY

Nanobeam Scanning Diffraction for Orientation Mapping of Polymers

(2017) Karen C. Bustillo et al.   MICROSCOPY AND MICROANALYSIS

Computational Methods for Large Scale Scanning Transmission Electron Microscopy (STEM) Experiments and Simulations

(2017) Colin Ophus et al.   MICROSCOPY AND MICROANALYSIS

Optimization of NBED simulations for disc-detection measurements

(2017) Tim Grieb et al.   ULTRAMICROSCOPY

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy

(2017) Knut Müller-Caspary et al.   ULTRAMICROSCOPY

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

(2017) Hao Yang et al.   ULTRAMICROSCOPY

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

(2017) Thomas C. Pekin et al.   ULTRAMICROSCOPY

STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens

(2017) Jan Oliver Oelerich et al.   ULTRAMICROSCOPY

Electron ptychographic microscopy for three-dimensional imaging

(2017) Si Gao et al.   Nature Communications

Dynamic-template-directed multiscale assembly for large-area coating of highly-aligned conjugated polymer thin films

(2017) Erfan Mohammadi et al.   Nature Communications

Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping

(2017) Ehsan Izadi et al.   MATERIALS & DESIGN

Electroplating lithium transition metal oxides

(2017) Huigang Zhang et al.   Science Advances

Electron Ptychographic Diffractive Imaging of Boron Atoms in LaB6 Crystals

(2017) Peng Wang et al.   Scientific Reports

Low-dose cryo electron ptychography via non-convex Bayesian optimization

(2017) Philipp Michael Pelz et al.   Scientific Reports

A pnCCD-based, fast direct single electron imaging camera for TEM and STEM

(2016) H. Ryll et al.   Journal of Instrumentation

Structure Determination of Superatom Metallic Clusters Using Rapid Scanning Electron Diffraction

(2016) Alina Bruma et al.   Journal of Physical Chemistry C

Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

(2016) Ouliana Panova et al.   MICRON

Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope

(2016) David Cooper et al.   MICRON

Study of Structure of Li- and Mn-rich Transition Metal Oxides Using 4D-STEM

(2016) Alpesh Khushalchand Shukla et al.   MICROSCOPY AND MICROANALYSIS

Developing Rapid and Advanced Visualisation of Magnetic Structures Using 2-D Pixelated STEM Detectors

(2016) Magnus Nord et al.   MICROSCOPY AND MICROANALYSIS

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy

(2016) Mark W. Tate et al.   MICROSCOPY AND MICROANALYSIS

Inversion of Dynamical Scattering from Large-Angle Rocking-Beam Electron Diffraction Patterns

(2016) Feng Wang et al.   PHYSICAL REVIEW LETTERS

Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

(2016) Hao Yang et al.   ULTRAMICROSCOPY

Phase contrast STEM for thin samples: Integrated differential phase contrast

(2016) Ivan Lazić et al.   ULTRAMICROSCOPY

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

(2016) Z. Chen et al.   ULTRAMICROSCOPY

Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffraction

(2016) C. Ebner et al.   ULTRAMICROSCOPY

Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast

(2016) Matus Krajnak et al.   ULTRAMICROSCOPY

Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry

(2016) Colin Ophus et al.   Nature Communications

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures

(2016) H. Yang et al.   Nature Communications

Direct observation of electronic-liquid-crystal phase transitions and their microscopic origin in La1/3Ca2/3MnO3

(2016) J. Tao et al.   Scientific Reports

Cross-sectional stress distribution in Al x Ga 1-x N heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction

(2016) M. Reisinger et al.   MATERIALS & DESIGN

Advances in 2D, 3D and 4D STEM Image Data Analysis

(2016) L. Jones et al.   MICROSCOPY AND MICROANALYSIS

Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

(2015) D. C. Bufford et al.   APPLIED PHYSICS LETTERS

Two-dimensional strain mapping in semiconductors by nano-beam electron diffraction employing a delay-line detector

(2015) Knut Müller-Caspary et al.   APPLIED PHYSICS LETTERS

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

(2015) V. B. Ozdol et al.   APPLIED PHYSICS LETTERS

Ptychographic Imaging in an Aberration Corrected STEM

(2015) Andrew R. Lupini et al.   MICROSCOPY AND MICROANALYSIS

In Situ Study of Lithiation and Delithiation of MoS2 Nanosheets Using Electrochemical Liquid Cell Transmission Electron Microscopy

(2015) Zhiyuan Zeng et al.   NANO LETTERS

Differential phase contrast: An integral perspective

(2015) A. Lubk et al.   PHYSICAL REVIEW A

Diffraction contrast imaging using virtual apertures

(2015) Christoph Gammer et al.   ULTRAMICROSCOPY

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

(2015) Christoph Mahr et al.   ULTRAMICROSCOPY

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

(2015) Timothy J. Pennycook et al.   ULTRAMICROSCOPY

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

(2015) Hao Yang et al.   ULTRAMICROSCOPY

Scanning precession electron tomography for three-dimensional nanoscale orientation imaging and crystallographic analysis

(2015) Alexander S. Eggeman et al.   Nature Communications

Interpretation of angular symmetries in electron nanodiffraction patterns from thin amorphous specimens

(2015) Amelia C. Y. Liu et al.   Acta Crystallographica A-Foundation and Advances

Precession electron diffraction – a topical review

(2015) Paul A. Midgley et al.   IUCrJ

Three-Dimensional Valency Mapping in Ceria Nanocrystals

(2014) Bart Goris et al.   ACS Nano

The microstructure and microtexture of zirconium oxide films studied by transmission electron backscatter diffraction and automated crystal orientation mapping with transmission electron microscopy

(2014) A. Garner et al.   ACTA MATERIALIA

Multi-Dimensional Electron Microscopy

(2014) Paul A. Midgley et al.   ANGEWANDTE CHEMIE-INTERNATIONAL EDITION

Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing

(2014) Hosni Idrissi et al.   APPLIED PHYSICS LETTERS

Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera

(2014) M. P. Vigouroux et al.   APPLIED PHYSICS LETTERS

Automated crystal orientation and phase mapping in TEM

(2014) E.F. Rauch et al.   MATERIALS CHARACTERIZATION

Recording and Using 4D-STEM Datasets in Materials Science

(2014) Colin Ophus et al.   MICROSCOPY AND MICROANALYSIS

Observing and measuring strain in nanostructures and devices with transmission electron microscopy

(2014) Martin J. Hÿtch et al.   MRS BULLETIN

Deterministic electron ptychography at atomic resolution

(2014) A. J. D'Alfonso et al.   PHYSICAL REVIEW B

Three-Dimensional Imaging of Individual Dopant Atoms inSrTiO3

(2014) Jinwoo Hwang et al.   PHYSICAL REVIEW LETTERS

Fast Imaging with Inelastically Scattered Electrons by Off-Axis Chromatic Confocal Electron Microscopy

(2014) Changlin Zheng et al.   PHYSICAL REVIEW LETTERS

Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopy

(2014) G. McMullan et al.   ULTRAMICROSCOPY

Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

(2014) Andrew B. Yankovich et al.   Nature Communications

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

(2014) Knut Müller et al.   Nature Communications

Improved strain precision with high spatial resolution using nanobeam precession electron diffraction

(2013) Jean-Luc Rouviere et al.   APPLIED PHYSICS LETTERS

Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope

(2013) N. BRODUSCH et al.   JOURNAL OF MICROSCOPY

Reconstructing state mixtures from diffraction measurements

(2013) Pierre Thibault et al.   NATURE

Electron counting and beam-induced motion correction enable near-atomic-resolution single-particle cryo-EM

(2013) Xueming Li et al.   NATURE METHODS

Systematic Mapping of Icosahedral Short-Range Order in a Melt-SpunZr36Cu64Metallic Glass

(2013) A. C. Y. Liu et al.   PHYSICAL REVIEW LETTERS

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

(2013) H. E et al.   ULTRAMICROSCOPY

Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals

(2013) A. Kobler et al.   ULTRAMICROSCOPY

Orientation precision of TEM-based orientation mapping techniques

(2013) A. Morawiec et al.   ULTRAMICROSCOPY

Image formation in the scanning transmission electron microscope using object-conjugate detectors

(2012) C. Dwyer et al.   ACTA CRYSTALLOGRAPHICA SECTION A

Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device

(2012) Knut Müller et al.   APPLIED PHYSICS LETTERS

3D Analysis of the Morphology and Spatial Distribution of Nitrogen in Nitrogen-Doped Carbon Nanotubes by Energy-Filtered Transmission Electron Microscopy Tomography

(2012) Ileana Florea et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Ptychographic transmission microscopy in three dimensions using a multi-slice approach

(2012) A. M. Maiden et al.   JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION

Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy

(2012) Knut Müller et al.   MICROSCOPY AND MICROANALYSIS

Bonding and structure of a reconstructed (001) surface of SrTiO3 from TEM

(2012) Guo-zhen Zhu et al.   NATURE

Differential phase-contrast microscopy at atomic resolution

(2012) Naoya Shibata et al.   Nature Physics

Nanoscale Structure and Structural Relaxation inZr50Cu45Al5Bulk Metallic Glass

(2012) Jinwoo Hwang et al.   PHYSICAL REVIEW LETTERS

Atom-Scale Ptychographic Electron Diffractive Imaging of Boron Nitride Cones

(2012) Corey T. Putkunz et al.   PHYSICAL REVIEW LETTERS

Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

(2012) Patrick W. Trimby   ULTRAMICROSCOPY

Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction

(2012) C.L. Zheng et al.   ULTRAMICROSCOPY

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

(2012) M.J. Humphry et al.   Nature Communications

Advance in Orientation Microscopy: Quantitative Analysis of Nanocrystalline Structures

(2011) Martin Seyring et al.   ACS Nano

Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material

(2011) Sorin Lazar et al.   ACTA CRYSTALLOGRAPHICA SECTION A

Confirmation of the Domino-Cascade Model by LiFePO4/FePO4Precession Electron Diffraction

(2011) G. Brunetti et al.   CHEMISTRY OF MATERIALS

A critical review of orientation microscopy in SEM and TEM

(2011) S. Zaefferer   CRYSTAL RESEARCH AND TECHNOLOGY

Nanobeam Diffraction: Technique Evaluation and Strain Measurement on Complementary Metal Oxide Semiconductor Devices

(2011) P. Favia et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

A Review of Strain Analysis Using Electron Backscatter Diffraction

(2011) Stuart I. Wright et al.   MICROSCOPY AND MICROANALYSIS

Imaging High-Energy Electrons Propagating in a Crystal

(2011) Joanne Etheridge et al.   PHYSICAL REVIEW LETTERS

Spatially resolved diffractometry with atomic-column resolution

(2011) Koji Kimoto et al.   ULTRAMICROSCOPY

Evaluation of two-dimensional strain distribution by STEM/NBD

(2011) Fumihiko Uesugi et al.   ULTRAMICROSCOPY

Domain structures and nanostructures in incommensurate antiferroelectric PbxLa1−x(Zr0.9Ti0.1)O3

(2010) Ian MacLaren et al.   JOURNAL OF APPLIED PHYSICS

Direct observation of local atomic order in a metallic glass

(2010) Akihiko Hirata et al.   NATURE MATERIALS

Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation

(2010) B. D. Forbes et al.   PHYSICAL REVIEW B

Wave-front phase retrieval in transmission electron microscopy via ptychography

(2010) F. Hüe et al.   PHYSICAL REVIEW B

Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy

(2010) Stephanie N. Bogle et al.   ULTRAMICROSCOPY

Dynamics of annular bright field imaging in scanning transmission electron microscopy

(2010) S.D. Findlay et al.   ULTRAMICROSCOPY

Aberration-compensated large-angle rocking-beam electron diffraction

(2010) Christoph T. Koch   ULTRAMICROSCOPY

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

(2010) Edgar F. Rauch et al.   ZEITSCHRIFT FUR KRISTALLOGRAPHIE

Improved precision in strain measurement using nanobeam electron diffraction

(2009) A. Béché et al.   APPLIED PHYSICS LETTERS

Three-dimensional imaging of carbon nanostructures by scanning confocal electron microscopy

(2009) Ayako Hashimoto et al.   JOURNAL OF APPLIED PHYSICS

High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

(2009) James M. LeBeau et al.   PHYSICAL REVIEW B

Direct Imaging of Nanoscale Phase Separation inLa0.55Ca0.45MnO3: Relationship to Colossal Magnetoresistance

(2009) J. Tao et al.   PHYSICAL REVIEW LETTERS

An improved ptychographical phase retrieval algorithm for diffractive imaging

(2009) Andrew M. Maiden et al.   ULTRAMICROSCOPY

Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography

(2009) Konrad Jarausch et al.   ULTRAMICROSCOPY

Position averaged convergent beam electron diffraction: Theory and applications

(2009) James M. LeBeau et al.   ULTRAMICROSCOPY

Strain relaxation in transistor channels with embedded epitaxial silicon germanium source/drain

(2008) J. P. Liu et al.   APPLIED PHYSICS LETTERS

Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display

(2008) B Schaffer et al.   MICROSCOPY AND MICROANALYSIS

A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope

(2008) T.A. Caswell et al.   ULTRAMICROSCOPY