Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

出版年份 2017 全文链接

标题

作者

关键词

4D-STEM, Pixelated detectors, Ptychography, Phase retrieval, Wigner distribution deconvolution

出版物

Volume 180, Issue -, Pages 173-179

出版商

Elsevier BV

发表日期

2017-04-01

DOI

10.1016/j.ultramic.2017.02.006

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