Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

标题
Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy
作者
关键词
Ptychography, Differential phase contrast, Scanning transmission electron microscopy
出版物
ULTRAMICROSCOPY
Volume 197, Issue -, Pages 112-121
出版商
Elsevier BV
发表日期
2018-12-18
DOI
10.1016/j.ultramic.2018.12.010

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