Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope

A critical review of orientation microscopy in SEM and TEM

(2011) S. Zaefferer   CRYSTAL RESEARCH AND TECHNOLOGY

High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes

(2011) P. Moeck et al.   CRYSTAL RESEARCH AND TECHNOLOGY

Transmission EBSD from 10 nm domains in a scanning electron microscope

(2011) R.R. KELLER et al.   JOURNAL OF MICROSCOPY

New Method of Transmission Electron Diffraction to Characterize Nanomaterials in the SEM

(2011) R Geiss et al.   MICROSCOPY AND MICROANALYSIS

Three-dimensional electron microscopy simulation with the CASINO Monte Carlo software

(2011) Hendrix Demers et al.   SCANNING

Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

(2011) H. H. Liu et al.   SCIENCE

Improving the mechanical reliability of cryomilled Al–Mg alloy using a two-stage spark plasma sintering cycle

(2011) B. Akinrinlola et al.   SCRIPTA MATERIALIA

Distribution of intermetallics in an AA 2099-T8 aluminium alloy extrusion

(2010) Y. Ma et al.   MATERIALS CHEMISTRY AND PHYSICS

Transmission Electron Diffraction From Nanoparticles, Nanowires and Thin Films in an SEM With Conventional EBSD Equipment

(2010) RH Geiss et al.   MICROSCOPY AND MICROANALYSIS

Electron energy loss and diffraction of backscattered electrons from silicon

(2010) Aimo Winkelmann et al.   NEW JOURNAL OF PHYSICS

Determination of crystal phase from an electron backscatter diffraction pattern

(2009) David J. Dingley et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction

(2009) A. WINKELMANN   JOURNAL OF MICROSCOPY

MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials

(2009) R Gauvin et al.   MICROSCOPY AND MICROANALYSIS

Use of an energy filter to improve the spatial resolution of electron backscatter diffraction

(2009) Abhishek Bhattacharyya et al.   SCANNING

Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching

(2009) Guilin Wu et al.   ULTRAMICROSCOPY

Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer

(2009) M.R. Went et al.   ULTRAMICROSCOPY

Energy-filtered electron backscatter diffraction

(2007) Andrew Deal et al.   ULTRAMICROSCOPY