Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction

标题
Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 125, Issue -, Pages 49-58
出版商
Elsevier BV
发表日期
2012-11-09
DOI
10.1016/j.ultramic.2012.10.002

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