Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

出版年份 2017 全文链接

标题

作者

关键词

Nanobeam electron diffraction, Strain measurement

出版物

ULTRAMICROSCOPY

Volume 176, Issue -, Pages 170-176

出版商

Elsevier BV

发表日期

2017-01-28

DOI

10.1016/j.ultramic.2016.12.021

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