Two-dimensional strain mapping in semiconductors by nano-beam electron diffraction employing a delay-line detector
出版年份 2015 全文链接
标题
Two-dimensional strain mapping in semiconductors by nano-beam electron diffraction employing a delay-line detector
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 107, Issue 7, Pages 072110
出版商
AIP Publishing
发表日期
2015-08-20
DOI
10.1063/1.4927837
参考文献
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