Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

标题
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
作者
关键词
STEM, Pixelated detectors, Ptycography, Phase contrast, Chromatic aberrations, DPC, ABF
出版物
ULTRAMICROSCOPY
Volume 151, Issue -, Pages 160-167
出版商
Elsevier BV
发表日期
2014-10-16
DOI
10.1016/j.ultramic.2014.09.013

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