SiO2 layer effect on atomic layer deposition Al2O3-based resistive switching memory

标题
SiO2 layer effect on atomic layer deposition Al2O3-based resistive switching memory
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 114, Issue 18, Pages 182102
出版商
AIP Publishing
发表日期
2019-05-08
DOI
10.1063/1.5085853

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