Resistive switching characteristics of Si3N4-based resistive-switching random-access memory cell with tunnel barrier for high density integration and low-power applications

标题
Resistive switching characteristics of Si3N4-based resistive-switching random-access memory cell with tunnel barrier for high density integration and low-power applications
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 106, Issue 21, Pages 212106
出版商
AIP Publishing
发表日期
2015-05-29
DOI
10.1063/1.4921926

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