A Theoretical and Experimental View on the Temperature Dependence of the Electronic Conduction through a Schottky Barrier in a Resistively Switching SrTiO3 -Based Memory Cell
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Title
A Theoretical and Experimental View on the Temperature Dependence of the Electronic Conduction through a Schottky Barrier in a Resistively Switching SrTiO3
-Based Memory Cell
Authors
Keywords
-
Journal
Advanced Electronic Materials
Volume 4, Issue 7, Pages 1800062
Publisher
Wiley
Online
2018-06-15
DOI
10.1002/aelm.201800062
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Note: Only part of the references are listed.- Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors
- (2016) Suhas Kumar et al. ADVANCED MATERIALS
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- (2016) Christoph Baeumer et al. Nature Communications
- Tailoring resistive switching in Pt/SrTiO3 junctions by stoichiometry control
- (2015) Evgeny Mikheev et al. Scientific Reports
- Impact of the cation-stoichiometry on the resistive switching and data retention of SrTiO3 thin films
- (2015) N. Raab et al. AIP Advances
- Nanoionic Resistive Switching Memories: On the Physical Nature of the Dynamic Reset Process
- (2015) Astrid Marchewka et al. Advanced Electronic Materials
- Role of oxygen vacancies in resistive switching in Pt/Nb-doped SrTiO3
- (2014) Jinho Park et al. APPLIED PHYSICS LETTERS
- A Combined Ab Initio and Experimental Study on the Nature of Conductive Filaments in ${\rm Pt}/{\rm Hf}{\rm O}_{2}/{\rm Pt}$ Resistive Random Access Memory
- (2014) Kan-Hao Xue et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- In-operando hard X-ray photoelectron spectroscopy study on the impact of current compliance and switching cycles on oxygen and carbon defects in resistive switching Ti/HfO2/TiN cells
- (2014) Malgorzata Sowinska et al. JOURNAL OF APPLIED PHYSICS
- Intrinsic Mobility Limiting Mechanisms in Lanthanum-Doped Strontium Titanate
- (2014) Amit Verma et al. PHYSICAL REVIEW LETTERS
- Determination of the electrostatic potential distribution in Pt/Fe:SrTiO3/Nb:SrTiO3 thin-film structures by electron holography
- (2014) Astrid Marchewka et al. Scientific Reports
- Charge-dependent oxygen vacancy diffusion in Al2O3-based resistive-random-access-memories
- (2013) Moon Young Yang et al. APPLIED PHYSICS LETTERS
- Vacancy Cohesion-Isolation Phase Transition Upon Charge Injection and Removal in Binary Oxide-Based RRAM Filamentary-Type Switching
- (2013) Katsumasa Kamiya et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Dislocation impact on resistive switching in single-crystal SrTiO3
- (2013) R. J. Kamaladasa et al. JOURNAL OF APPLIED PHYSICS
- Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part II: Modeling
- (2012) Stefano Larentis et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Oxygen vacancy filament formation in TiO2: A kinetic Monte Carlo study
- (2012) Duo Li et al. JOURNAL OF APPLIED PHYSICS
- Memristive devices for computing
- (2012) J. Joshua Yang et al. Nature Nanotechnology
- Transport properties of oxygen vacancy filaments in metal/crystalline or amorphous HfO2/metal structures
- (2012) Xavier Cartoixà et al. PHYSICAL REVIEW B
- Electronic structure of oxygen vacancies inSrTiO3andLaAlO3
- (2012) C. Mitra et al. PHYSICAL REVIEW B
- Strength of the Effective Coulomb Interaction at Metal and Insulator Surfaces
- (2012) Ersoy Şaşıoğlu et al. PHYSICAL REVIEW LETTERS
- Origin of the Ultra-nonlinear Switching Kinetics in Oxide-Based Resistive Switches
- (2011) Stephan Menzel et al. ADVANCED FUNCTIONAL MATERIALS
- Computational investigations into the operating window for memristive devices based on homogeneous ionic motion
- (2011) Mohammad Noman et al. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
- Conduction mechanism of TiN/HfOx/Pt resistive switching memory: A trap-assisted-tunneling model
- (2011) Shimeng Yu et al. APPLIED PHYSICS LETTERS
- Impact of Temperature on the Resistive Switching Behavior of Embedded $\hbox{HfO}_{2}$-Based RRAM Devices
- (2011) Christian Walczyk et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- VESTA 3for three-dimensional visualization of crystal, volumetric and morphology data
- (2011) Koichi Momma et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Conductive Path Formation in the Ta2O5 Atomic Switch: First-Principles Analyses
- (2010) Tingkun Gu et al. ACS Nano
- Direct Identification of the Conducting Channels in a Functioning Memristive Device
- (2010) John Paul Strachan et al. ADVANCED MATERIALS
- Impact of Oxygen Vacancy Ordering on the Formation of a Conductive Filament in $\hbox{TiO}_{2}$ for Resistive Switching Memory
- (2010) Seong-Geon Park et al. IEEE ELECTRON DEVICE LETTERS
- Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
- (2009) Rainer Waser et al. ADVANCED MATERIALS
- Electronic transport and colossal electroresistance in SrTiO3:Nb-based Schottky junctions
- (2009) D. S. Shang et al. APPLIED PHYSICS LETTERS
- Schottky barriers at transition-metal/SrTiO3(001)interfaces
- (2009) M. Mrovec et al. PHYSICAL REVIEW B
- Memristive switching mechanism for metal/oxide/metal nanodevices
- (2008) J. Joshua Yang et al. Nature Nanotechnology
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