Impact of Temperature on the Resistive Switching Behavior of Embedded $\hbox{HfO}_{2}$-Based RRAM Devices

Published 2011 View Full Article

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Title
Impact of Temperature on the Resistive Switching Behavior of Embedded $\hbox{HfO}_{2}$-Based RRAM Devices
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 9, Pages 3124-3131
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-07-14
DOI
10.1109/ted.2011.2160265

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