High-quality crack-free GaN epitaxial films grown on Si substrates by a two-step growth of AlN buffer layer
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Title
High-quality crack-free GaN epitaxial films grown on Si substrates by a two-step growth of AlN buffer layer
Authors
Keywords
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Journal
CRYSTENGCOMM
Volume 18, Issue 14, Pages 2446-2454
Publisher
Royal Society of Chemistry (RSC)
Online
2016-03-03
DOI
10.1039/c5ce02525g
References
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