Evidence for low-energy ions influencing plasma-assisted atomic layer deposition of SiO2: Impact on the growth per cycle and wet etch rate
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Title
Evidence for low-energy ions influencing plasma-assisted atomic layer deposition of SiO2: Impact on the growth per cycle and wet etch rate
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 117, Issue 3, Pages 031602
Publisher
AIP Publishing
Online
2020-07-22
DOI
10.1063/5.0015379
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