Influence of deposition temperature of thermal ALD deposited Al2O3 films on silicon surface passivation
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Title
Influence of deposition temperature of thermal ALD deposited Al2O3 films on silicon surface passivation
Authors
Keywords
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Journal
AIP Advances
Volume 5, Issue 6, Pages 067113
Publisher
AIP Publishing
Online
2015-06-06
DOI
10.1063/1.4922267
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Note: Only part of the references are listed.- Effect of low thermal budget annealing on surface passivation of silicon by ALD based aluminum oxide films
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