In situ atomic layer deposition study of HfO2 growth on NH4OH and atomic hydrogen treated Al0.25Ga0.75N
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Title
In situ atomic layer deposition study of HfO2 growth on NH4OH and atomic hydrogen treated Al0.25Ga0.75N
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 24, Pages 244102
Publisher
AIP Publishing
Online
2013-06-28
DOI
10.1063/1.4812243
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Related references
Note: Only part of the references are listed.- Interfacial oxide re-growth in thin film metal oxide III-V semiconductor systems
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- In-situ X-ray photoelectron spectroscopy of trimethyl aluminum and water half-cycle treatments on HF-treated and O3-oxidized GaN substrates
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- (2009) Rakesh Sohal et al. APPLIED SURFACE SCIENCE
- Atomic Layer Deposition: An Overview
- (2009) Steven M. George CHEMICAL REVIEWS
- Half-Cycle Atomic Layer Deposition Reaction Study Using O[sub 3] and H[sub 2]O Oxidation of Al[sub 2]O[sub 3] on In[sub 0.53]Ga[sub 0.47]As
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- S passivation of GaAs and band bending reduction upon atomic layer deposition of HfO2/Al2O3 nanolaminates
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- Indium stability on InGaAs during atomic H surface cleaning
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- AlGaN/GaN MOS-HEMT With $\hbox{HfO}_{2}$ Dielectric and $\hbox{Al}_{2}\hbox{O}_{3}$ Interfacial Passivation Layer Grown by Atomic Layer Deposition
- (2008) Yuanzheng Yue et al. IEEE ELECTRON DEVICE LETTERS
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