Direct Observation of Hole Current in Amorphous Oxide Semiconductors under Illumination

The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination

(2011) Jeong Hwan Kim et al.   APPLIED PHYSICS LETTERS

The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor

(2010) Jang-Yeon Kwon et al.   APPLIED PHYSICS LETTERS

The influence of SiOx and SiNx passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination

(2010) Joon Seok Park et al.   APPLIED PHYSICS LETTERS

Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics

(2010) Kwang Hwan Ji et al.   IEEE ELECTRON DEVICE LETTERS

Spectroscopic Investigation on the Origin of Photoinduced Carrier Generation in Semiconducting InGaO and InGaZnO Films

(2010) Deok-Yong Cho et al.   Journal of Physical Chemistry C

The Effect of Density-of-State on the Temperature and Gate Bias-Induced Instability of InGaZnO Thin Film Transistors

(2010) Kwang Hwan Ji et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

(2009) Jae-Heon Shin et al.   ETRI JOURNAL

Energy band alignment of SiO2/ZnO interface determined by x-ray photoelectron spectroscopy

(2009) J. B. You et al.   JOURNAL OF APPLIED PHYSICS

Electronic structure of amorphous InGaO3(ZnO)0.5 thin films

(2009) Deok-Yong Cho et al.   THIN SOLID FILMS

Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy

(2008) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Factors controlling electron transport properties in transparent amorphous oxide semiconductors

(2008) Hideo Hosono et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

Amorphous oxide channel TFTs

(2007) Hideya Kumomi et al.   THIN SOLID FILMS