Highly stable amorphous In-Ga-Zn-O thin-film transistors produced by eliminating deep subgap defects

Correlation of photoconductivity response of amorphous In–Ga–Zn–O films with transistor performance using microwave photoconductivity decay method

(2011) Satoshi Yasuno et al.   APPLIED PHYSICS LETTERS

Depth analysis of subgap electronic states in amorphous oxide semiconductor, a-In-Ga-Zn-O, studied by hard x-ray photoelectron spectroscopy

(2011) Kenji Nomura et al.   JOURNAL OF APPLIED PHYSICS

Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

(2010) John F. Conley   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Interface and bulk effects for bias—light-illumination instability in amorphous-In—Ga—Zn—O thin-film transistors

(2010) Kenji Nomura et al.   Journal of the Society for Information Display

Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors

(2009) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Electronic structure of the amorphous oxide semiconductor a-InGaZnO4-x: Tauc-Lorentz optical model and origins of subgap states

(2009) Toshio Kamiya et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

DC sputter deposition of amorphous indium–gallium–zinc–oxide (a-IGZO) films with H2O introduction

(2009) Takafumi Aoi et al.   THIN SOLID FILMS

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Defect passivation and homogenization of amorphous oxide thin-film transistor by wet O2 annealing

(2008) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS