Hydrogen Bistability as the Origin of Photo-Bias-Thermal Instabilities in Amorphous Oxide Semiconductors
出版年份 2015 全文链接
标题
Hydrogen Bistability as the Origin of Photo-Bias-Thermal Instabilities in Amorphous Oxide Semiconductors
作者
关键词
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出版物
Advanced Electronic Materials
Volume 1, Issue 7, Pages 1400006
出版商
Wiley
发表日期
2015-05-09
DOI
10.1002/aelm.201400006
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