Enhancement of resistive switching ratio induced by competing interfacial oxygen diffusion in tantalum oxide based memories with metal nitride electrode

Title
Enhancement of resistive switching ratio induced by competing interfacial oxygen diffusion in tantalum oxide based memories with metal nitride electrode
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 113, Issue 4, Pages 043503
Publisher
AIP Publishing
Online
2018-07-25
DOI
10.1063/1.5037840

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