Highly reliable switching via phase transition using hydrogen peroxide in homogeneous and multi-layered GaZnOx-based resistive random access memory devices
Published 2015 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Highly reliable switching via phase transition using hydrogen peroxide in homogeneous and multi-layered GaZnOx-based resistive random access memory devices
Authors
Keywords
-
Journal
CHEMICAL COMMUNICATIONS
Volume 51, Issue 44, Pages 9173-9176
Publisher
Royal Society of Chemistry (RSC)
Online
2015-04-27
DOI
10.1039/c4cc10209f
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Evolution of conductive filament and its impact on reliability issues in oxide-electrolyte based resistive random access memory
- (2015) Hangbing Lv et al. Scientific Reports
- Enhanced Electrical Characteristics and Stability via Simultaneous Ultraviolet and Thermal Treatment of Passivated Amorphous In–Ga–Zn–O Thin-Film Transistors
- (2014) Young Jun Tak et al. ACS Applied Materials & Interfaces
- Improvement in Negative Bias Stress Stability of Solution-Processed Amorphous In–Ga–Zn–O Thin-Film Transistors Using Hydrogen Peroxide
- (2014) Jeong Moo Kwon et al. ACS Applied Materials & Interfaces
- Thermally stable and high ON/OFF ratio non-volatile memory devices based on poly(triphenylamine) with pendent PCBM
- (2014) Chih-Jung Chen et al. CHEMICAL COMMUNICATIONS
- Enhanced resistive switching effect upon illumination in self-assembled NiWO4nano-nests
- (2014) Bai Sun et al. CHEMICAL COMMUNICATIONS
- Recent progress in resistive random access memories: Materials, switching mechanisms, and performance
- (2014) F. Pan et al. MATERIALS SCIENCE & ENGINEERING R-REPORTS
- A journey towards reliability improvement of TiO2 based Resistive Random Access Memory: A review
- (2014) D. Acharyya et al. MICROELECTRONICS RELIABILITY
- The effects of Ta2O5–ZnO films as cathodic buffer layers in inverted polymer solar cells
- (2014) Jo-Lin Lan et al. Journal of Materials Chemistry A
- Simultaneous engineering of the interface and bulk layer of Al/sol-NiOx/Si structured resistive random access memory devices
- (2014) Doo Hyun Yoon et al. Journal of Materials Chemistry C
- Chemical Stability and Electrical Performance of Dual-Active-Layered Zinc–Tin–Oxide/Indium–Gallium–Zinc–Oxide Thin-Film Transistors Using a Solution Process
- (2013) Chul Ho Kim et al. ACS Applied Materials & Interfaces
- Insertion of a Si layer to reduce operation current for resistive random access memory applications
- (2013) Yu-Ting Chen et al. APPLIED PHYSICS LETTERS
- Low power W:AlOx/WOx bilayer resistive switching structure based on conductive filament formation and rupture mechanism
- (2013) Yue Bai et al. APPLIED PHYSICS LETTERS
- Grain boundaries as preferential sites for resistive switching in the HfO2 resistive random access memory structures
- (2012) M. Lanza et al. APPLIED PHYSICS LETTERS
- Low-voltage driving solution-processed nickel oxide based unipolar resistive switching memory with Ni nanoparticles
- (2012) Doo Hyun Yoon et al. JOURNAL OF MATERIALS CHEMISTRY
- A study on low-power, nanosecond operation and multilevel bipolar resistance switching in Ti/ZrO2/Pt nonvolatile memory with 1T1R architecture
- (2012) Ming-Chi Wu et al. SEMICONDUCTOR SCIENCE AND TECHNOLOGY
- Effects of Ti incorporation on the interface properties and band alignment of HfTaOx thin films on sulfur passivated GaAs
- (2011) T. Das et al. APPLIED PHYSICS LETTERS
- Flexible Resistive Switching Memory Device Based on Amorphous InGaZnO Film With Excellent Mechanical Endurance
- (2011) Z. Q. Wang et al. IEEE ELECTRON DEVICE LETTERS
- Resistive switching mechanisms in random access memory devices incorporating transition metal oxides: TiO2, NiO and Pr0.7Ca0.3MnO3
- (2011) Blanka Magyari-Köpe et al. NANOTECHNOLOGY
- Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
- (2009) Rainer Waser et al. ADVANCED MATERIALS
- Fully Room-Temperature-Fabricated Nonvolatile Resistive Memory for Ultrafast and High-Density Memory Application
- (2009) Yu Chao Yang et al. NANO LETTERS
- Unipolar resistive switching characteristics of ZnO thin films for nonvolatile memory applications
- (2008) Wen-Yuan Chang et al. APPLIED PHYSICS LETTERS
- Investigation on doping dependency of solution-processed Ga-doped ZnO thin film transistor
- (2008) Won Jun Park et al. APPLIED PHYSICS LETTERS
- Characteristics and mechanism of conduction/set process in TiN∕ZnO∕Pt resistance switching random-access memories
- (2008) Nuo Xu et al. APPLIED PHYSICS LETTERS
- ZnO metal-semiconductor field-effect transistors with Ag-Schottky gates
- (2008) H. Frenzel et al. APPLIED PHYSICS LETTERS
- Surface modification of ZnO film by hydrogen peroxide solution
- (2008) Chia-Hung Tsai et al. JOURNAL OF APPLIED PHYSICS
- Programmable Resistance Switching in Nanoscale Two-Terminal Devices
- (2008) Sung Hyun Jo et al. NANO LETTERS
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationAdd your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload Now