Evolution of conductive filament and its impact on reliability issues in oxide-electrolyte based resistive random access memory
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Title
Evolution of conductive filament and its impact on reliability issues in oxide-electrolyte based resistive random access memory
Authors
Keywords
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Journal
Scientific Reports
Volume 5, Issue 1, Pages -
Publisher
Springer Nature
Online
2015-01-14
DOI
10.1038/srep07764
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Note: Only part of the references are listed.- Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte-Based ReRAM
- (2012) Qi Liu et al. ADVANCED MATERIALS
- A Light-Controlled Resistive Switching Memory
- (2012) Mariana Ungureanu et al. ADVANCED MATERIALS
- Observation of Conductance Quantization in Oxide-Based Resistive Switching Memory
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- (2012) Stephan Menzel et al. JOURNAL OF APPLIED PHYSICS
- Memristive devices for computing
- (2012) J. Joshua Yang et al. Nature Nanotechnology
- Metal–Oxide RRAM
- (2012) H.-S. Philip Wong et al. PROCEEDINGS OF THE IEEE
- Emerging memories: resistive switching mechanisms and current status
- (2012) Doo Seok Jeong et al. REPORTS ON PROGRESS IN PHYSICS
- Observation of conducting filament growth in nanoscale resistive memories
- (2012) Yuchao Yang et al. Nature Communications
- Conduction mechanism of TiN/HfOx/Pt resistive switching memory: A trap-assisted-tunneling model
- (2011) Shimeng Yu et al. APPLIED PHYSICS LETTERS
- Redox Reaction Switching Mechanism in RRAM Device With $\hbox{Pt/CoSiO}_{X}\hbox{/}\hbox{TiN}$ Structure
- (2011) Yong-En Syu et al. IEEE ELECTRON DEVICE LETTERS
- Controllable Growth of Nanoscale Conductive Filaments in Solid-Electrolyte-Based ReRAM by Using a Metal Nanocrystal Covered Bottom Electrode
- (2010) Qi Liu et al. ACS Nano
- Bipolar Resistive Switching Memory Using Cu Metallic Filament in Ge[sub 0.4]Se[sub 0.6] Solid Electrolyte
- (2010) S. Z. Rahaman et al. ELECTROCHEMICAL AND SOLID STATE LETTERS
- Atomic structure of conducting nanofilaments in TiO2 resistive switching memory
- (2010) Deok-Hwang Kwon et al. Nature Nanotechnology
- Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
- (2009) Rainer Waser et al. ADVANCED MATERIALS
- Study of Multilevel Programming in Programmable Metallization Cell (PMC) Memory
- (2009) Ugo Russo et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- CMOS Compatible Nanoscale Nonvolatile Resistance Switching Memory
- (2008) Sung Hyun Jo et al. NANO LETTERS
- Memristive switching mechanism for metal/oxide/metal nanodevices
- (2008) J. Joshua Yang et al. Nature Nanotechnology
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