Increase of reverse leakage current at homoepitaxial GaN p-n junctions induced by continuous forward current stress
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Title
Increase of reverse leakage current at homoepitaxial GaN p-n junctions induced by continuous forward current stress
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 118, Issue 25, Pages 253501
Publisher
AIP Publishing
Online
2021-06-23
DOI
10.1063/5.0053139
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