Correlation between dislocations and leakage current of p-n diodes on a free-standing GaN substrate
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Title
Correlation between dislocations and leakage current of p-n diodes on a free-standing GaN substrate
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 112, Issue 18, Pages 182106
Publisher
AIP Publishing
Online
2018-05-05
DOI
10.1063/1.5024704
References
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Related references
Note: Only part of the references are listed.- Effect of dislocations on the growth of p-type GaN and on the characteristics of p-n diodes
- (2017) Shigeyoshi Usami et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- 1.7-kV and 0.55-$\text{m}\Omega \cdot \text {cm}^{2}$ GaN p-n Diodes on Bulk GaN Substrates With Avalanche Capability
- (2016) Kazuki Nomoto et al. IEEE ELECTRON DEVICE LETTERS
- Time-Dependent Failure of GaN-on-Si Power HEMTs With p-GaN Gate
- (2016) Isabella Rossetto et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- High breakdown voltage p-n diodes on GaN on sapphire by MOCVD
- (2016) Chirag Gupta et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- Progress in bulk GaN growth
- (2015) Ke Xu et al. Chinese Physics B
- Origin and Control of OFF-State Leakage Current in GaN-on-Si Vertical Diodes
- (2015) Yuhao Zhang et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Vertical Power p-n Diodes Based on Bulk GaN
- (2015) Isik C. Kizilyalli et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Material science and device physics in SiC technology for high-voltage power devices
- (2015) Tsunenobu Kimoto JAPANESE JOURNAL OF APPLIED PHYSICS
- Investigation of leakage current paths in n-GaN by conductive atomic force microscopy
- (2014) Bumho Kim et al. APPLIED PHYSICS LETTERS
- Electronic structure and metallization effects at threading dislocation cores in GaN
- (2014) I. Belabbas et al. COMPUTATIONAL MATERIALS SCIENCE
- GaN-on-Si Vertical Schottky and p-n Diodes
- (2014) IEEE ELECTRON DEVICE LETTERS
- Recent progress of GaN power devices for automotive applications
- (2014) Tetsu Kachi JAPANESE JOURNAL OF APPLIED PHYSICS
- Impact of surface morphology above threading dislocations on leakage current in 4H-SiC diodes
- (2012) Hirokazu Fujiwara et al. APPLIED PHYSICS LETTERS
- Over 3.0 $\hbox{GW/cm}^{2}$ Figure-of-Merit GaN p-n Junction Diodes on Free-Standing GaN Substrates
- (2011) Yoshitomo Hatakeyama et al. IEEE ELECTRON DEVICE LETTERS
- Growth and strain characterization of high quality GaN crystal by HVPE
- (2011) Huiyuan Geng et al. JOURNAL OF CRYSTAL GROWTH
- Recent achievements in AMMONO-bulk method
- (2010) R. Dwiliński et al. JOURNAL OF CRYSTAL GROWTH
- Fabrication of 3-in GaN substrates by hydride vapor phase epitaxy using void-assisted separation method
- (2007) Takehiro Yoshida et al. JOURNAL OF CRYSTAL GROWTH
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