Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision

Title
Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision
Authors
Keywords
-
Journal
Remote Sensing
Volume 13, Issue 1, Pages 26
Publisher
MDPI AG
Online
2020-12-24
DOI
10.3390/rs13010026

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