Wettability, interfacial reactions, and impact strength of Sn–3.0Ag–0.5Cu solder/ENIG substrate used for fluxless soldering under formic acid atmosphere
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Title
Wettability, interfacial reactions, and impact strength of Sn–3.0Ag–0.5Cu solder/ENIG substrate used for fluxless soldering under formic acid atmosphere
Authors
Keywords
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Journal
JOURNAL OF MATERIALS SCIENCE
Volume 55, Issue 7, Pages 3107-3117
Publisher
Springer Science and Business Media LLC
Online
2019-10-31
DOI
10.1007/s10853-019-04153-9
References
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Related references
Note: Only part of the references are listed.- In-situ observation of fluxless soldering of Sn-3.0Ag-0.5Cu/Cu under a formic acid atmosphere
- (2019) Siliang He et al. MATERIALS CHEMISTRY AND PHYSICS
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- (2018) Hyunju Lee et al. MICROELECTRONICS RELIABILITY
- Residual free solder process for fluxless solder pastes
- (2018) Alexander Hanss et al. SOLDERING & SURFACE MOUNT TECHNOLOGY
- Characterizing the Soldering Alloy Type In–Ag–Ti and the Study of Direct Soldering of SiC Ceramics and Copper
- (2018) Roman Koleňák et al. Metals
- Effect of Sn grain orientation on growth of Cu-Sn intermetallic compounds during thermomigration in Cu-Sn2.3Ag-Ni microbumps
- (2018) Yu-An Shen et al. MATERIALS LETTERS
- A review of lead-free solders for electronics applications
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- Wetting and spreading kinetics of liquid Sn on Ag and Ag 3 Sn substrates
- (2017) O.Y. Liashenko et al. SCRIPTA MATERIALIA
- Effect of Sn grain orientation on formation of Cu 6 Sn 5 intermetallic compounds during electromigration
- (2017) Yu-An Shen et al. SCRIPTA MATERIALIA
- Problem with no-clean flux spattering on in-circuit testing pads diagnosed by EDS analysis
- (2016) K. Dušek et al. MICROELECTRONICS RELIABILITY
- Flux effect on void quantity and size in soldered joints
- (2016) D. Bušek et al. MICROELECTRONICS RELIABILITY
- Thermogravimetric investigation on the interaction of formic acid with solder joint materials
- (2016) Fosca Conti et al. NEW JOURNAL OF CHEMISTRY
- Impact strength of Sn–3.0Ag–0.5Cu solder bumps during isothermal aging
- (2014) JianXin Wang et al. MICROELECTRONICS RELIABILITY
- A review: On the development of low melting temperature Pb-free solders
- (2014) Hiren R. Kotadia et al. MICROELECTRONICS RELIABILITY
- Effects of third element and surface finish on interfacial reactions of Sn–Ag–xCu (or Ni)/(Cu or ENIG) solder joints
- (2010) Jeong-Won Yoon et al. JOURNAL OF ALLOYS AND COMPOUNDS
- Effect of oxide thickness of solder powders on the coalescence of SnAgCu lead-free solder pastes
- (2009) Shasha Zhang et al. JOURNAL OF ALLOYS AND COMPOUNDS
- Viscosity and Surface Tension of Liquid Sn-Cu Lead-Free Solders
- (2009) N. Zhao et al. JOURNAL OF ELECTRONIC MATERIALS
- Generation of Tin(II) Oxide Crystals on Lead-Free Solder Joints in Deionized Water
- (2009) Hong Chang et al. JOURNAL OF ELECTRONIC MATERIALS
- Wetting in Soldering and Microelectronics
- (2008) T. Matsumoto et al. Annual Review of Materials Research
- A Comparative Study of Reactive Wetting of Lead and Lead-Free Solders on Cu and (Cu6Sn5/Cu3Sn)/Cu Substrates
- (2008) Hongqin Wang et al. JOURNAL OF ELECTRONIC MATERIALS
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