Resistivity scaling and electron surface scattering in epitaxial Co(0001) layers
Published 2019 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Resistivity scaling and electron surface scattering in epitaxial Co(0001) layers
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 125, Issue 24, Pages 245105
Publisher
AIP Publishing
Online
2019-06-25
DOI
10.1063/1.5086458
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Conductive surface oxide on CrN(001) layers
- (2019) Mary E. McGahay et al. APPLIED PHYSICS LETTERS
- Copper Interconnects: Surface State Engineering to Facilitate Specular Electron Scattering
- (2019) Erik Milosevic et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Sub-100 nm2 Cobalt Interconnects
- (2018) Shibesh Dutta et al. IEEE ELECTRON DEVICE LETTERS
- The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges
- (2018) Tianji Zhou et al. JOURNAL OF APPLIED PHYSICS
- Defect and grain boundary scattering in tungsten: A combined theoretical and experimental study
- (2018) Nicholas A. Lanzillo et al. JOURNAL OF APPLIED PHYSICS
- Growth and properties of epitaxial Ti1−xMgxN(001) layers
- (2018) Baiwei Wang et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Resistivity size effect in epitaxial Ru(0001) layers
- (2018) Erik Milosevic et al. JOURNAL OF APPLIED PHYSICS
- Annealing and Impurity Effects in Co Thin Films for MOL Contact and BEOL Metallization
- (2018) J. Kelly et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- The Critical Role of pH Gradient Formation in Driving Superconformal Cobalt Deposition
- (2018) Matthew A. Rigsby et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- The anisotropic size effect of the electrical resistivity of metal thin films: Tungsten
- (2017) Pengyuan Zheng et al. JOURNAL OF APPLIED PHYSICS
- Surface roughness dependence of the electrical resistivity of W(001) layers
- (2017) P. Y. Zheng et al. JOURNAL OF APPLIED PHYSICS
- Size effects and charge transport in metals: Quantum theory of the resistivity of nanometric metallic structures arising from electron scattering by grain boundaries and by rough surfaces
- (2017) Raul C. Munoz et al. Applied Physics Reviews
- Electron mean free path in elemental metals
- (2016) Daniel Gall JOURNAL OF APPLIED PHYSICS
- Electron channeling in TiO2coated Cu layers
- (2016) Pengyuan Zheng et al. SEMICONDUCTOR SCIENCE AND TECHNOLOGY
- Reducing Grain-Boundary Resistivity of Copper Nanowires by Doping
- (2016) Mathieu César et al. Physical Review Applied
- Epitaxial growth of tungsten layers on MgO(001)
- (2015) Pengyuan Zheng et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Cobalt advanced barrier metallization: A resistivity composition analysis
- (2015) M. Wislicenus et al. MICROELECTRONIC ENGINEERING
- Effects of nanoscale surface roughness on the resistivity of ultrathin epitaxial copper films
- (2015) Yukta P Timalsina et al. NANOTECHNOLOGY
- Ni doping on Cu surfaces: Reduced copper resistivity
- (2014) P. Y. Zheng et al. APPLIED PHYSICS LETTERS
- Failure of semiclassical models to describe resistivity of nanometric, polycrystalline tungsten films
- (2014) Dooho Choi et al. JOURNAL OF APPLIED PHYSICS
- Surface and grain boundary scattering in nanometric Cu thin films: A quantitative analysis including twin boundaries
- (2014) Katayun Barmak et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- The electron scattering at grain boundaries in tungsten films
- (2014) Dooho Choi MICROELECTRONIC ENGINEERING
- Calculated Resistances of Single Grain Boundaries in Copper
- (2014) Mathieu César et al. Physical Review Applied
- Simulation of electrical conduction in thin polycrystalline metallic films: Impact of microstructure
- (2013) J. M. Rickman et al. JOURNAL OF APPLIED PHYSICS
- Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films
- (2012) Dooho Choi et al. PHYSICAL REVIEW B
- Electron scattering at surfaces and grain boundaries in Cu thin films and wires
- (2011) J. S. Chawla et al. PHYSICAL REVIEW B
- Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point
- (2010) Y. F. Zhu et al. ACS Nano
- Effect of O2 adsorption on electron scattering at Cu(001) surfaces
- (2010) J. S. Chawla et al. APPLIED PHYSICS LETTERS
- Tungsten Contact and Line Resistance Reduction with Advanced Pulsed Nucleation Layer and Low Resistivity Tungsten Treatment
- (2010) Anand Chandrashekar et al. JAPANESE JOURNAL OF APPLIED PHYSICS
- Morphology of TiN thin films grown on MgO(001) by reactive dc magnetron sputtering
- (2010) A. S. Ingason et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Large Discrete Resistance Jump at Grain Boundary in Copper Nanowire
- (2010) Tae-Hwan Kim et al. NANO LETTERS
- Resistivity of thin Cu films coated with Ta, Ti, Ru, Al, and Pd barrier layers from first principles
- (2010) Ferdows Zahid et al. PHYSICAL REVIEW B
- Specular electron scattering at single-crystal Cu(001) surfaces
- (2009) J. S. Chawla et al. APPLIED PHYSICS LETTERS
- Domain structure of epitaxial Co films with perpendicular anisotropy
- (2009) J. Brandenburg et al. PHYSICAL REVIEW B
- Resistivity of thin Cu films with surface roughness
- (2009) Youqi Ke et al. PHYSICAL REVIEW B
- The influence of surface roughness on electrical conductance of thin Cu films: An ab initio study
- (2008) V. Timoshevskii et al. JOURNAL OF APPLIED PHYSICS
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExploreAsk a Question. Answer a Question.
Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.
Get Started