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Title
Charge Scattering and Mobility in Atomically Thin Semiconductors
Authors
Keywords
-
Journal
Physical Review X
Volume 4, Issue 1, Pages -
Publisher
American Physical Society (APS)
Online
2014-03-19
DOI
10.1103/physrevx.4.011043
References
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Related references
Note: Only part of the references are listed.- Remote phonon and impurity screening effect of substrate and gate dielectric on electron dynamics in single layer MoS2
- (2013) Lang Zeng et al. APPLIED PHYSICS LETTERS
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- (2012) Karel-Alexander N. Duerloo et al. Journal of Physical Chemistry Letters
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- (2012) J. T. Ye et al. SCIENCE
- Probing charge scattering mechanisms in suspended graphene by varying its dielectric environment
- (2012) A.K.M. Newaz et al. Nature Communications
- High-mobility and low-power thin-film transistors based on multilayer MoS2 crystals
- (2012) Sunkook Kim et al. Nature Communications
- Inelastic scattering and current saturation in graphene
- (2010) Vasili Perebeinos et al. PHYSICAL REVIEW B
- Effect of high-κgate dielectrics on charge transport in graphene-based field effect transistors
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- Atomically ThinMoS2: A New Direct-Gap Semiconductor
- (2010) Kin Fai Mak et al. PHYSICAL REVIEW LETTERS
- Intrinsic and extrinsic performance limits of graphene devices on SiO2
- (2008) Jian-Hao Chen et al. Nature Nanotechnology
- Substrate-limited electron dynamics in graphene
- (2008) S. Fratini et al. PHYSICAL REVIEW B
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