Thickness-Dependent Interfacial Coulomb Scattering in Atomically Thin Field-Effect Transistors

Published 2013 View Full Article

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Title
Thickness-Dependent Interfacial Coulomb Scattering in Atomically Thin Field-Effect Transistors
Authors
Keywords
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Journal
NANO LETTERS
Volume 13, Issue 8, Pages 3546-3552
Publisher
American Chemical Society (ACS)
Online
2013-07-17
DOI
10.1021/nl4010783

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