Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips

Title
Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 90, Issue 15, Pages -
Publisher
American Physical Society (APS)
Online
2014-10-31
DOI
10.1103/physrevb.90.155455

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