Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips
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Title
Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 90, Issue 15, Pages -
Publisher
American Physical Society (APS)
Online
2014-10-31
DOI
10.1103/physrevb.90.155455
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