Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)

Imaging the charge distribution within a single molecule

(2012) Fabian Mohn et al.   Nature Nanotechnology

Kelvin probe force microscopy characterization of TiO2 (110)-supported Au clusters

(2011) Hong Jing Chung et al.   APPLIED PHYSICS LETTERS

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

(2011) Franck Bocquet et al.   PHYSICAL REVIEW B

AFM tip characterization by Kelvin probe force microscopy

(2010) C Barth et al.   NEW JOURNAL OF PHYSICS

Simulation method of Kelvin probe force microscopy at nanometer range and its application

(2010) A. Masago et al.   PHYSICAL REVIEW B

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

(2009) Sascha Sadewasser et al.   PHYSICAL REVIEW LETTERS

Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy

(2009) Laurent Nony et al.   PHYSICAL REVIEW LETTERS

The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

(2009) L. Gross et al.   SCIENCE

Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

(2008) F. Krok et al.   PHYSICAL REVIEW B

Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on theTiO2(110)Surface

(2008) G. H. Enevoldsen et al.   PHYSICAL REVIEW LETTERS