Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips
出版年份 2014 全文链接
标题
Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips
作者
关键词
-
出版物
PHYSICAL REVIEW B
Volume 90, Issue 15, Pages -
出版商
American Physical Society (APS)
发表日期
2014-10-31
DOI
10.1103/physrevb.90.155455
参考文献
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