Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms
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Title
Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 83, Issue 3, Pages -
Publisher
American Physical Society (APS)
Online
2011-01-21
DOI
10.1103/physrevb.83.035411
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